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Volumn B, Issue , 2003, Pages 1001-1004

Optical mismatch in double AR coated c-Si, a simple theoretical and experimental correlation

Author keywords

[No Author keywords available]

Indexed keywords

OPTICAL MISMATCH; REFLECTION MEASUREMENTS; REFLECTION SPECTRA; SILICON NITRIDE FILMS;

EID: 6344231612     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (2)

References (5)
  • 5
    • 6344255525 scopus 로고    scopus 로고
    • Master thesis. Electrical Engineering, CINVESTAV-IPN, Mexico in press
    • J.Aguilar, Master thesis. Electrical Engineering, CINVESTAV-IPN, Mexico (2003) in press
    • (2003)
    • Aguilar, J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.