Secondary and backscattered electron imaging of weathered chromian spinel

Scanning

Volumn 26, Issue 5, 2004, Pages 240-249

  Pooley, Gregory D ^a  

^a UNIVERSITY OF WESTERN AUSTRALIA   (Australia)

Author keywords

Alteration; Chromian spinel; Conventional and environmental scanning electron microscopes; Secondary and backscattered electron microscopy; X ray microanalysis

Indexed keywords

BACKSCATTERING; CONCENTRATION (PROCESS); IMAGING TECHNIQUES; MINERAL RESOURCES; SCANNING ELECTRON MICROSCOPY; WEATHERING; X RAY ANALYSIS;

BACKSCATTERED ELECTRONS (BSE); CHROMIAN SPINELS; DISPERSION ANOMALIES; TARGET MINERALS;

ELECTRONS;

CHROMIAN SPINEL; CHROMIUM; DIAMOND; GOLD; MINERAL; NICKEL; PLATINUM; SECONDARY ELECTRON; UNCLASSIFIED DRUG;

ARTICLE; AUSTRALIA; BACKSCATTERED ELECTRON; CHEMICAL ANALYSIS; DISCRIMINANT ANALYSIS; ELECTRON; ELECTRON MICROSCOPY; ENVIRONMENTAL FACTOR; IMAGE ANALYSIS; IMAGING SYSTEM; MINERALOGY; PRIORITY JOURNAL; SCANNING ELECTRON MICROSCOPY; X RAY MICROANALYSIS;

CONCENTRATION; ELECTRONS; IMAGE ANALYSIS; MINERAL DEPOSITS; SCANNING ELECTRON MICROSCOPY; SCATTERING; WEATHERING; X RAY ANALYSIS;

EID: 6344229200     PISSN: 01610457     EISSN: None     Source Type: Journal    
DOI: 10.1002/sca.4950260505     Document Type: Article

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