Correlation between film thickness and critical current density of MgB 2 films

Superconductor Science and Technology

Volumn 17, Issue 10, 2004, Pages 1126-1128

  Wang, Shu Fang ^a,b   Liu, Zhen ^a   Zhou, Yue Liang ^a   Zhu, Ya Bin ^a   Chen, Zheng Hao ^a   Lu, Hui Bin ^a   Cheng, Bo Lin ^a   Yang, Guo Zhen ^a  

^a INSTITUTE OF PHYSICS   (China)

^b HEBEI UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL VAPOR DEPOSITION; CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); DIFFUSION; MORPHOLOGY; SCANNING ELECTRON MICROSCOPY; SINGLE CRYSTALS; SQUIDS; SUPERCONDUCTING FILMS; SUPERCONDUCTIVITY; X RAY DIFFRACTION ANALYSIS; YTTRIUM BARIUM COPPER OXIDES;

BORON FILMS; FILM THICKNESS; LATTICE MISMATCHES; MICROSTRUCTURAL MORPHOLOGY;

MAGNESIUM COMPOUNDS;

EID: 6344228564     PISSN: 09532048     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-2048/17/10/006     Document Type: Article

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