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Volumn A, Issue , 2003, Pages 42-45
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Property control of textured ETP CVD deposited ZnO(:Al) for application in thin film solar cells
a b c c a c b
a
TNO
(Netherlands)
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Author keywords
[No Author keywords available]
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Indexed keywords
EXPANDING THERMAL PLASMAS (ETP);
SPECTROSCOPIC ELLIPSOMETRY;
TRANSPARENT CONDUCTING OXIDES (TCO);
ATOMIC FORCE MICROSCOPY;
CHEMICAL VAPOR DEPOSITION;
ELLIPSOMETRY;
OPTOELECTRONIC DEVICES;
PLASMAS;
QUANTUM EFFICIENCY;
SCANNING ELECTRON MICROSCOPY;
SOLAR CELLS;
TEXTURES;
THIN FILMS;
ZINC OXIDE;
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EID: 6344228469
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (2)
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References (13)
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