On-chip interconnect inductance - friend or foe

Proceedings - International Symposium on Quality Electronic Design, ISQED

Volumn 2003-January, Issue , 2003, Pages 389-394

  Wong, S Simon ^a   Yue, Patrick ^a   Chang, Richard ^a   Kim, So Young ^a   Kleveland, Bendik ^a   O'Mahony, Frank ^a  

^a STANFORD UNIVERSITY   (United States)

Author keywords

Capacitance; Circuit simulation; Data mining; Frequency; Inductance; Integrated circuit interconnections; Magnetic fields; System on a chip; Testing; Wire

Indexed keywords

APPLICATION SPECIFIC INTEGRATED CIRCUITS; CAPACITANCE; CIRCUIT SIMULATION; DATA MINING; INDUCTANCE; INTEGRATED CIRCUIT TESTING; MAGNETIC FIELDS; MICROPROCESSOR CHIPS; SYSTEM-ON-CHIP; TESTING; WIRE;

FREQUENCY; HIGH SPEED CIRCUIT; INTEGRATED CIRCUIT INTERCONNECTIONS; ON CHIP INTERCONNECT; ON CHIPS; OPERATION FREQUENCY; RETURN PATHS; SYSTEM ON A CHIP;

INTEGRATED CIRCUIT INTERCONNECTS;

EID: 6344227257     PISSN: 19483287     EISSN: 19483295     Source Type: Conference Proceeding    
DOI: 10.1109/ISQED.2003.1194764     Document Type: Conference Paper

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