Layer model approach to background correction in r.f.-GDOES

Surface and Interface Analysis

Volumn 36, Issue 10, 2004, Pages 1384-1391

  Payling, R ^a,b   Nelis, T ^a   Aeberhard, M ^a   Michler, J ^a   Seris, P ^c  

^a SWISS FEDERAL LABORATORIES FOR MATERIALS SCIENCE AND TECHNOLOGY   (Switzerland)

^b UNIVERSITY OF NEWCASTLE   (Australia)

^c Jobin Yvon   (France)

Author keywords

Background correction; GDOES; Layer model; Radiofrequency

Indexed keywords

ALGORITHMS; EMISSION SPECTROSCOPY; HYDROGEN; LIGHT SCATTERING; RADIOFREQUENCY SPECTROSCOPY; ROBUSTNESS (CONTROL SYSTEMS);

BACKGROUND CORRECTION; GDOES; LAYER MODEL; RADIOFREQUENCY;

SIGNAL PROCESSING;

EID: 6344221530     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/sia.1929     Document Type: Article

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