Representation and estimation of spectral reflectances using projection on PCA and wavelet bases

Color Research and Application

Volumn 33, Issue 6, 2008, Pages 485-493

  Mansouri, Alamin ^a   Sliwa, Tadeusz ^a   Hardeberg, Jon Y ^b   Voisin, Yvon ^a  

^a UNIVERSITÉ DE BOURGOGNE   (France)

^b NORWEGIAN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Norway)

Author keywords

Linear model; Multispectral imaging; Principal component analysis; Reflectance estimation; Wavelet

Indexed keywords

ESTIMATION; INVERSE PROBLEMS; MATHEMATICAL MODELS; REFLECTION; RESTORATION;

BASIS FUNCTIONS; BOUNDARY ARTIFACTS; FOURIER; GOODNESS OF FITS; INPUT DATUM; LINEAR MODEL; MULTISPECTRAL IMAGING; PCA METHODS; RE-CONSTRUCTION PROCESS; REFLECTANCE ESTIMATION; SPECTRAL REFLECTANCES; TRAINING SETS; WAVELET; WAVELET BASIS;

PRINCIPAL COMPONENT ANALYSIS;

EID: 63249127151     PISSN: 03612317     EISSN: 15206378     Source Type: Journal    
DOI: 10.1002/col.20442     Document Type: Conference Paper

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