Statistical analysis of low-level material screening measurements via gamma-spectroscopy

Applied Radiation and Isotopes

Volumn 67, Issue 5, 2009, Pages 741-745

  Heisel, M ^a   Kaether, F ^a   Simgen, H ^a  

^a MAX PLANCK INSTITUT FÜR KERNPHYSIK   (Germany)

Author keywords

Bayesian statistics; Confidence interval; Gamma spectrometry; Material screening; Upper limit

Indexed keywords

BAYESIAN STATISTICS; CONFIDENCE INTERVAL; GAMMA-SPECTROMETRY; MATERIAL SCREENING; UPPER LIMIT;

BAYESIAN NETWORKS; RADIOISOTOPES; SPECTROMETERS; SPECTROMETRY;

FINANCIAL DATA PROCESSING;

RADIOISOTOPE;

ARTICLE; BAYES THEOREM; CONFIDENCE INTERVAL; GAMMA SPECTROMETRY; LOW ENERGY RADIATION; PRIORITY JOURNAL; SCREENING; SPECTRUM; STANDARD; STATISTICAL ANALYSIS;

BAYES THEOREM; INTERNATIONALITY; RADIOISOTOPES; REFERENCE STANDARDS; SPECTROMETRY, GAMMA;

EID: 63249121144     PISSN: 09698043     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apradiso.2009.01.028     Document Type: Article

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