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Volumn , Issue , 2008, Pages 152-157

Design and verification of distributed industrial manufacturing control systems

Author keywords

[No Author keywords available]

Indexed keywords

CONCURRENCY CONTROL; EMBEDDED SYSTEMS; INDUSTRIAL ELECTRONICS; INTEGRATED CIRCUITS; REUSABILITY;

EID: 63149191229     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IECON.2008.4757944     Document Type: Conference Paper
Times cited : (9)

References (32)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.