Microscopic origin of current degradation of fully-sealed carbon-nanotube field emission display

Solid State Communications

Volumn 149, Issue 17-18, 2009, Pages 670-672

  Kim, Seungchul ^a   Cho, Eunae ^b   Han, Seungwu ^b   Cho, Youngmi ^c   Cho, Sung Hee ^c   Kim, Changwook ^c   Ihm, Jisoon ^a  

^a Seoul National University   (South Korea)

^b Ewha Womans University   (South Korea)

^c Samsung SDI   (South Korea)

Author keywords

A. CH3 radical; D. Current degradation; D. Field emission display

Indexed keywords

CARBON NANOTUBES; DEGRADATION; DYNAMICS; FIELD EMISSION; MOLECULAR DYNAMICS; NANOTUBES;

A. CH3 RADICAL; AB INITIO METHODS; D. CURRENT DEGRADATION; D. FIELD EMISSION DISPLAY; DEGRADATION MECHANISMS; ELECTRICAL RESISTANCES; EMISSION CURRENTS; EMISSION PROPERTIES; MATERIAL SELECTIONS; MOLECULAR DYNAMICS SIMULATIONS; ORGANIC MATERIALS; PRISTINE NANOTUBES; RESIDUAL GAS ANALYSIS; THERMAL DESTRUCTIONS;

FIELD EMISSION DISPLAYS;

EID: 63149185401     PISSN: 00381098     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ssc.2009.02.025     Document Type: Article

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