Where are the geometrically necessary dislocations accommodating small imprints?

Journal of Materials Research

Volumn 24, Issue 3, 2009, Pages 647-651

  Rester, Martin ^a   Motz, C ^a   Pippan, R ^a  

^a ERICH SCHMID INSTITUTE OF MATERIALS SCIENCE   (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON BACK-SCATTER DIFFRACTIONS; GEOMETRICALLY NECESSARY DISLOCATIONS; MIS ORIENTATIONS; MISORIENTATION GRADIENTS; TEM; TWIN BOUNDARIES;

CRYSTAL ORIENTATION; DISLOCATIONS (CRYSTALS); ELECTRON DIFFRACTION; TRANSMISSION ELECTRON MICROSCOPY;

SINGLE CRYSTALS;

EID: 63149158669     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/jmr.2009.0131     Document Type: Article

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