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Volumn 43, Issue 3, 2009, Pages 630-636

Uranium speciation as a function of depth in contaminated hanford sediments - A micro-XRF, micro-XRD, and micro- and bulk-XAFS study

Author keywords

[No Author keywords available]

Indexed keywords

HANFORD SEDIMENTS; HANFORD SITES; HOT-SPOTS; METATORBERNITE; MICRO X RAYS; MICRO X-RAY DIFFRACTIONS; MICRO-X-RAY FLUORESCENCES; MICRO-XRD; MICRO-XRF; MICROMETER-SIZED PARTICLES; MODERATE CONCENTRATIONS; SURFACE COATINGS; TEXTURED GRAINS; VADOSE ZONES; WATER TABLES; X-RAY ABSORPTION FINE STRUCTURES; X-RAY AMORPHOUS; XAFS; XANES SPECTROSCOPIES; XRD;

EID: 63149143424     PISSN: 0013936X     EISSN: 15205851     Source Type: Journal    
DOI: 10.1021/es8021045     Document Type: Article
Times cited : (86)

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