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Volumn 24, Issue 4, 2009, Pages 407-412
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Measuring 0.01‰ to 0.1‰ isotopic variations by MC-ICPMS - Testing limits for the first time with Pb δ-iCRMs
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Author keywords
[No Author keywords available]
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Indexed keywords
INDUCTIVELY COUPLED PLASMA MASS SPECTROMETRY;
ISOTOPES;
LEAD ALLOYS;
MASS SPECTROMETERS;
SEMICONDUCTOR COUNTERS;
ISOTOPE RATIOS;
ISOTOPIC CERTIFIED REFERENCE MATERIALS;
ISOTOPIC COMPOSITIONS;
ISOTOPIC MEASUREMENTS;
ISOTOPIC VARIATIONS;
LOW LEVELS;
MASS DISCRIMINATIONS;
MC-ICP-MS;
MEASUREMENT STRATEGIES;
REFERENCE VALUES;
RELATIVE COMBINED UNCERTAINTIES;
RELATIVE UNCERTAINTIES;
SHORT TERMS;
TEST SAMPLES;
LEAD;
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EID: 63049122448
PISSN: 02679477
EISSN: 13645544
Source Type: Journal
DOI: 10.1039/b821403b Document Type: Article |
Times cited : (10)
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References (30)
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