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Volumn , Issue , 2008, Pages 754-756

Characterization of elevated cpw on different substrates for high speed digital interconnects

Author keywords

Elevated coplanar waveguide; Insertion loss; Pulse shaping

Indexed keywords

BANDPASS FILTERS; COPLANAR WAVEGUIDES; ELECTRIC LINES; INSERTION LOSSES; MICROWAVES; POWER TRANSMISSION; TRANSMISSION LINE THEORY;

EID: 63049097252     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/AMTA.2008.4763059     Document Type: Conference Paper
Times cited : (3)

References (9)
  • 1
    • 16244402676 scopus 로고    scopus 로고
    • Nonlinear transmission lines for pulse shaping in silicon
    • March
    • Afshari, E., Hajimiri, A. "Nonlinear transmission lines for pulse shaping in silicon", IEEE Journal of Solid-State Circuits, Vol. 40, Issue 3, March 2005 pp 744-752.
    • (2005) IEEE Journal of Solid-State Circuits , vol.40 , Issue.3 , pp. 744-752
    • Afshari, E.1    Hajimiri, A.2
  • 5
    • 0001555184 scopus 로고
    • A Very small, low loss MMIC rat race hybrid using elevated coplanar waveguides
    • H.Kamitsuna., "A Very small, low loss MMIC rat race hybrid using elevated coplanar waveguides",.IEEE Microwave and Guided Wave letters, vol. 62, pp 337-339, 1992
    • (1992) IEEE Microwave and Guided Wave letters , vol.62 , pp. 337-339
    • Kamitsuna, H.1
  • 6
    • 0022865691 scopus 로고
    • Considerations in the use of coplanar waveguide for millimeter-wave integrated circuits
    • R.W. Jackson, Considerations in the use of coplanar waveguide for millimeter-wave integrated circuits, IEEE Trans. Microwave Theory Techno. 34 (12) (1986) 1450-1456.
    • (1986) IEEE Trans. Microwave Theory Techno , vol.34 , Issue.12 , pp. 1450-1456
    • Jackson, R.W.1
  • 8
    • 0029274878 scopus 로고
    • Analysis of a novel Elevated Coupled waveguide with finite metallization thickness
    • March, April
    • S.Raju, B.N. Nityanadan and V. Abhaikumar "Analysis of a novel Elevated Coupled waveguide with finite metallization thickness" Journal of IETE, vol 41, No.2,pp. 143-149. March - April 1995
    • (1995) Journal of IETE , vol.41 , Issue.2 , pp. 143-149
    • Raju, S.1    Nityanadan, B.N.2    Abhaikumar, V.3
  • 9
    • 0026908091 scopus 로고    scopus 로고
    • William R.Eisenstadt, S-Parameter based IC Interconnect Transmission line Characterization, IEEE Transactions on Components, hybrids and manufacturing technology, l5,No 4,August 1992
    • William R.Eisenstadt, "S-Parameter based IC Interconnect Transmission line Characterization", IEEE Transactions on Components, hybrids and manufacturing technology, vol.l5,No 4,August 1992


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.