Spectroscopys studies of iron phthalocyanine thin films

Advanced Materials Research

Volumn 55-57, Issue , 2008, Pages 301-304

  Chamlek, O ^a   Pratontep, S ^b   Kerdcharoen, T ^a   Osotchan, T ^a  

^a MAHIDOL UNIVERSITY   (Thailand)

^b NATIONAL ELECTRONICS AND COMPUTER TECHNOLOGY CENTER   (Thailand)

Author keywords

Phthalocyanine; Raman spectroscopy; X ray absorption spectroscopy; X ray photoemission spectroscopy

Indexed keywords

ACETONE; CRYSTAL ATOMIC STRUCTURE; FUNCTIONAL MATERIALS; INTELLIGENT MATERIALS; IRON; NANOSTRUCTURED MATERIALS; PHOTOELECTRON SPECTROSCOPY; POWDERS; PURIFICATION; RAMAN SPECTROSCOPY; SPECTROMETERS; THIN FILMS; X RAY ABSORPTION NEAR EDGE STRUCTURE SPECTROSCOPY; X RAY ABSORPTION SPECTROSCOPY; X RAY PHOTOELECTRON SPECTROSCOPY;

ABSORPTION SPECTROMETERS; ACETONE VAPORS; IRON PHTHALOCYANINES; METHANOL VAPORS; PHTHALOCYANINE; X RAY PHOTOEMISSION SPECTROSCOPY; X-RAY ABSORPTION NEAR-EDGE STRUCTURE; XPS SPECTRA;

LIGHT ABSORPTION;

EID: 62949245294     PISSN: 10226680     EISSN: None     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/amr.55-57.301     Document Type: Conference Paper

References (5)

1. J. F. Fernandez-Sanchez, T. Nezel, R. Steiger and U. E. Spichiger-Keller: Sensors and Actuators B. Vol. 113 (2006), p. 630.
2. Q. Zhou and R.D. Gould: Phys Rev. Vol. 58 (1998), p. 829.
3. M.S. Roy, M. Kumar, P. Jaiswal and G.D. Sharma: Radiation measurements. Vol. 38 (2004), p. 205.
4. J. Szuber, B. Szcsepaniak, S. Kochowski and A. Opilski: Thin Solid Films. Vol. 237 (1994), p. 272.
5. L. Lozzi, S. Picozzi, S. Santucci, C. Cantalini and B. Delley: J. of Elec. Spec. and Rel. Phen. Vol.137 (2004), p. 101.