Study of microstructured indium oxide by cathodoluminescence and XPS microscopy

Superlattices and Microstructures

Volumn 45, Issue 4-5, 2009, Pages 429-434

  Magdas, D A ^a   Maestre, D ^a   Cremades, A ^a   Gregoratti, L ^b   Piqueras, J ^a  

^a UNIVERSIDAD COMPLUTENSE DE MADRID   (Spain)

^b SINCROTRONE TRIESTE   (Italy)

Author keywords

Cathodoluminescence; Growth from vapour; Semiconducting oxides; X ray photoelectron spectroscopy

Indexed keywords

CATHODOLUMINESCENCE; ELECTRON SPECTROSCOPY; EMISSION SPECTROSCOPY; GRAIN BOUNDARIES; INDIUM; LIGHT EMISSION; OXYGEN; PHOTOELECTRICITY; PHOTOIONIZATION; PHOTONS; SEMICONDUCTOR GROWTH; SINTERING; SPECTRUM ANALYSIS;

BOUNDARY REGIONS; CORE LEVELS; EMISSION BANDS; GROWTH FROM VAPOUR; INDIUM OXIDES; MICRO- AND NANOSTRUCTURES; MICROCRYSTALLINE FILMS; ROOM TEMPERATURES; SEMICONDUCTING OXIDES; SPECTROMICROSCOPY; STARTING MATERIALS; TWO COMPONENTS; XPS; XPS SPECTRUM;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 62949210090     PISSN: 07496036     EISSN: 10963677     Source Type: Journal    
DOI: 10.1016/j.spmi.2008.10.002     Document Type: Article

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