XRD and FTIR characterization of nanocrystalline YVO4: Eu derived by coprecipitation process

Zeitschrift fur Kristallographie, Supplement

Volumn , Issue 27, 2008, Pages 121-126

  Borca, E ^a,b,c   Bereu, M ^a,b,c   Georgescu, S ^a,b,c   Hodorogea, S ^a,b,c   Cotoi, E ^a,b,c  

^a UNIVERSITY OF BUCHAREST   (Romania)

^b NATIONAL INSTITUTE FOR LASER   (Romania)

^c Wallachian University of Targoviste   (Romania)

Author keywords

Crystallite size; FTIR; Line broadening; Nanophosphors; XRD

Indexed keywords

EID: 62749178041     PISSN: 0930486X     EISSN: None     Source Type: Journal    
DOI: 10.1524/zksu.2008.0016     Document Type: Conference Paper

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