Automatic freckles detection and retouching

IEEE Convention of Electrical and Electronics Engineers in Israel, Proceedings

Volumn , Issue , 2008, Pages 142-146

  Lipowezky, Uri ^a   Cahen, Sarah ^b  

^a Samsung Advanced Institute of Technology (SAIT)   (South Korea)

^b JERUSALEM COLLEGE OF TECHNOLOGY   (Israel)

Author keywords

Autoregressive processes; Color; Face recognition; Feature extraction

Indexed keywords

AUTOREGRESSIVE PROCESSES; COLOR FEATURES; EARLY DIAGNOSIS; FACE LOCATIONS; FACIAL FEATURES; MALIGNANT MELANOMAS; POTENTIAL APPLICATIONS; SKIN DETECTIONS;

BLENDING; COLOR; FEATURE EXTRACTION; SKIN;

FACE RECOGNITION;

EID: 62749173568     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/EEEI.2008.4736675     Document Type: Conference Paper

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