|
Volumn 24, Issue 6, 2008, Pages
|
Transmission eigenvalues and the nondestructive testing of dielectrics
|
Author keywords
[No Author keywords available]
|
Indexed keywords
NONDESTRUCTIVE EXAMINATION;
EIGEN VALUES;
ELECTROMAGNETIC SCATTERINGS;
NON-DESTRUCTIVE TESTING;
DIELECTRIC MATERIALS;
|
EID: 62649116875
PISSN: 02665611
EISSN: 13616420
Source Type: Journal
DOI: 10.1088/0266-5611/24/6/065016 Document Type: Article |
Times cited : (76)
|
References (9)
|