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Volumn 45, Issue 6, 2009, Pages 300-302
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90nm TCAM cell design with leakage suppression technique
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Author keywords
[No Author keywords available]
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Indexed keywords
LEAKAGE CURRENTS;
CELL DESIGNS;
LEAKAGE POWER;
LEAKAGE POWER REDUCTIONS;
LEAKAGE SUPPRESSIONS;
PERFORMANCE PENALTIES;
PROCESS TECHNOLOGIES;
TERNARY CONTENT-ADDRESSABLE MEMORIES;
LOGIC GATES;
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EID: 62549158240
PISSN: 00135194
EISSN: None
Source Type: Journal
DOI: 10.1049/el.2009.3733 Document Type: Article |
Times cited : (5)
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References (3)
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