Field distribution in an electrospray ionization source determined by finite element method

Rapid Communications in Mass Spectrometry

Volumn 23, Issue 5, 2009, Pages 689-697

  Zhong, Xuefei ^a   Yi, Rong ^a   Holliday, Alison E ^b   Chen, David D Y ^a  

^a UNIVERSITY OF BRITISH COLUMBIA   (Canada)

^b SWARTHMORE COLLEGE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FIELDS; ELECTRIC LINES; ELECTROSPRAY IONIZATION; FINITE ELEMENT METHOD; ION SOURCES; SOLS;

COMPUTER MODELS; CONDITION; ELECTRIC FIELD DISTRIBUTIONS; ELECTRIC FIELD STRENGTH; ELECTROSPRAY IONIZATION SOURCES; ELECTROSPRAYS; FIELD DISTRIBUTION; MULTI-PHYSICS; OPTIMUM SIGNALS; STATIC ELECTRIC FIELDS;

ATMOSPHERIC PRESSURE;

EID: 62549138309     PISSN: 09514198     EISSN: 10970231     Source Type: Journal    
DOI: 10.1002/rcm.3914     Document Type: Article

References (17)

1. Yamashita M, Fenn JB. J. Phys. Chem. 1984; 88: 4451.
2. Simith RD, Loo JA, Edmonds CG, Barinaga CJ, Udesth HR. Anal. Chem. 1990; 62: 882.
3. Wilm M, Mann M. Anal. Chem. 1996; 68: 1.
4. Sadiku MNO. Elements of Electromagnetics. Saunders College: New York, 1989; 263.
5. Eyring CF, Mackeown SS, Millikan RA. Phys. Rev. 1928; 31: 900.
6. Smith DPH. IEEE Transactions on Industry Applications 1986; 22: 527.
7. Jones AR, Thong KC. J. Phys. D - Appl. Phys. 1971; 4: 1159.
8. Heddle DWO. Electrostatic Lens Systems, (2nd edn). Institute of Physics Publishing: London, 2000; 27.
9. Gupta OP. Finite and Boundary Element Methods in Engineering. A.A. Balkema: The Netherlands, 1999; 5.
10. Sadiku MNO. Elements of Electromagnetics. Saunders College: New York, 1989; 671.
11. Manura DJ, Dahl DA. SIMIONTM 8.0 Users Manual, Idaho National Laboratory, 2006; 114.
12. Evans G, Blackledge J, Yardley P. Numerical Methods for Partial Differential Equations. Springer: London, 2000; 202.
13. Sadiku MNO. Elements of Electromagnetics. Saunders College: New York, 1989; 699.
14. Scheider BB, Douglas DJ, Chen DDY. Rapid Commun. Mass Spectrom. 2001; 15: 2168.
15. Scheider BB, Douglas DJ, Chen DDY. J. Am. Soc. Mass Spectrom. 2002; 13: 906.
16. Thompson JW, Eschelbach JW, Wilburn RT, Jorgenson JW. J. Am. Soc. Mass Spectrom. 2005; 16: 312.
17. Timmerman P, van der Weele JP. Am. J. Phys. 1999; 67: 538.