Capacitance-voltage profiling of quantum well structures

Journal of Applied Physics

Volumn 79, Issue 9, 1996, Pages 7005-7013

  Tschirner, B M ^a   Morier Genoud, F ^a   Martin, D ^a   Reinhart, F K ^a  

^a EPFL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 6244257784     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.361466     Document Type: Article

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