Optical characterization of InGaAs-GaAs multiple quantum wells using variable angle spectroscopic ellipsometry for designing tunable modulators

Journal of Applied Physics

Volumn 81, Issue 1, 1997, Pages 497-501

  Cheung, S K ^a   Wang, H ^a   Huang, W ^a   Jain, F ^a  

^a UNIVERSITY OF CONNECTICUT   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 6244229760     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.364125     Document Type: Article

References (16)

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