Low loss ceramic dielectrics for microwave filters

IEE Colloquium (Digest)

Volumn , Issue 154, 1997, Pages

  Penn, S J ^a   Alford, N McN ^a   Templeton, A ^a   Klein, N ^b   Gallop, J C ^c   Filhol, P ^d   Wang, X ^a  

^a LONDON SOUTH BANK UNIVERSITY   (United Kingdom)

^b FORSCHUNGSZENTRUM JÜLICH   (Germany)

^c NATIONAL PHYSICAL LABORATORY   (United Kingdom)

^d Tekelec Components   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA; BARIUM COMPOUNDS; CERAMIC MATERIALS; DISLOCATIONS (CRYSTALS); DOPING (ADDITIVES); ELECTRIC LOSSES; MICROWAVE FILTERS; POLYCRYSTALLINE MATERIALS; Q FACTOR MEASUREMENT; SAPPHIRE; SINGLE CRYSTALS; ZIRCONIUM COMPOUNDS;

BARIUM MAGNESIUM TANTALATE; ZIRCONIUM TIN TITANATE;

DIELECTRIC MATERIALS;

EID: 6244223762     PISSN: 09633308     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (5)

1. D. Kajfez and P. Guillon, Dielectric Resonators, (Artech House, Zurich, 1986)
2. Alford N McN and Penn S J, "Sintered alumina with low dielectric loss", J. Appl. Phys., 80 5895-5898 (1996)
3. S. Penn, N. McN. Alford, A. Templeton, M. Xu, X. Wang, M. Reece and K. Scrapel, "Effect of Porosity and Grain Size on the Dielectric Properties of Sintered Alumina", J. Am. Ceram. Soc. In Press.
4. V. B. Braginsky, V. S. Ilchenko and K. S. Bagdassarov. Physics Letters A 120 p300-305 (1987)
5. S. J. Penn, N. McN. Alford and T. W. Button, "High Q Dielectric Resonators using Yba2Cu3Ox Thick Films and Polycrystalline Dielectrics", IEEE Trans. Appl. Supercond. (1997) in Press.