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Volumn , Issue , 2008, Pages 176-181

Adaptive SRAM memory for low power and high yield

Author keywords

[No Author keywords available]

Indexed keywords

6T CELLS; AREA OVERHEADS; BIT LINES; COLUMN BASIS; DESIGN PHASE; FEATURE SIZES; FINE-GRAINED CONTROLS; FIXED VOLTAGES; HIGH YIELDS; LOW-POWER; MULTIPLE SUPPLY VOLTAGES; REAL-WORLD; SRAM MEMORIES; SUPPLY VOLTAGES; VOLTAGE ASSIGNMENTS; YIELD TARGETS;

EID: 62349095031     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICCD.2008.4751858     Document Type: Conference Paper
Times cited : (5)

References (8)
  • 2
    • 85190272845 scopus 로고    scopus 로고
    • J. Massey, I. Microeletronics, and V. Essex Junction, NBTI: What we know and what we need to know-A tutorial addressing the current understanding and challenges for the future, Integrated Reliability Workshop Final Report, 2004 IEEE International, pp. 199-211, 2004.
    • J. Massey, I. Microeletronics, and V. Essex Junction, "NBTI: What we know and what we need to know-A tutorial addressing the current understanding and challenges for the future," Integrated Reliability Workshop Final Report, 2004 IEEE International, pp. 199-211, 2004.
  • 4
    • 34548216018 scopus 로고    scopus 로고
    • Analysis of a Novel Electrically Programmable Active Fuse for Advanced CMOS SOI One-Time Programmable Memory Applications
    • A. Hoefler, C. Henson, C.-N. Li, and D.-G. Lin, "Analysis of a Novel Electrically Programmable Active Fuse for Advanced CMOS SOI One-Time Programmable Memory Applications," Solid-State Device Research Conference, 2006.
    • (2006) Solid-State Device Research Conference
    • Hoefler, A.1    Henson, C.2    Li, C.-N.3    Lin, D.-G.4
  • 7
    • 34249809773 scopus 로고    scopus 로고
    • Design of a Process Variation Tolerant Self-Repairing SRAM for Yield Enhancement in Nanoscaled CMOS
    • S. Mukhopadhyay, K. Kim, H. Mahmoodi, and K. Roy, "Design of a Process Variation Tolerant Self-Repairing SRAM for Yield Enhancement in Nanoscaled CMOS," IEEE Journal of Solid-State Circuits, 2007.
    • (2007) IEEE Journal of Solid-State Circuits
    • Mukhopadhyay, S.1    Kim, K.2    Mahmoodi, H.3    Roy, K.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.