High-accuracy and robust localization of large control markers for geometric camera calibration

IEEE Transactions on Pattern Analysis and Machine Intelligence

Volumn 31, Issue 2, 2009, Pages 376-383

  Douxchamps, Damien ^a   Chihara, Kunihiro ^a  

^a NARA INSTITUTE OF SCIENCE AND TECHNOLOGY   (Japan)

Author keywords

Camera calibration; High resolution; Image measurement; Imaging geometry; Noise; Ray tracing; Subpixel

Indexed keywords

CAMERA CALIBRATION; HIGH RESOLUTION; IMAGE MEASUREMENT; IMAGING GEOMETRY; NOISE; SUBPIXEL;

CALIBRATION; ELEMENTARY PARTICLE SOURCES; ERROR CORRECTION; LIGHT MEASUREMENT; ROBUSTNESS (CONTROL SYSTEMS);

CAMERAS;

ALGORITHM; ARTICLE; ARTIFACT; ARTIFICIAL INTELLIGENCE; AUTOMATED PATTERN RECOGNITION; CALIBRATION; COMPUTER ASSISTED DIAGNOSIS; IMAGE ENHANCEMENT; INSTRUMENTATION; METHODOLOGY; PHOTOGRAPHY; REPRODUCIBILITY; SENSITIVITY AND SPECIFICITY; THREE DIMENSIONAL IMAGING;

ALGORITHMS; ARTIFACTS; ARTIFICIAL INTELLIGENCE; CALIBRATION; IMAGE ENHANCEMENT; IMAGE INTERPRETATION, COMPUTER-ASSISTED; IMAGING, THREE-DIMENSIONAL; PATTERN RECOGNITION, AUTOMATED; PHOTOGRAMMETRY; REPRODUCIBILITY OF RESULTS; SENSITIVITY AND SPECIFICITY;

EID: 62249165175     PISSN: 01628828     EISSN: None     Source Type: Journal    
DOI: 10.1109/TPAMI.2008.214     Document Type: Article

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