Piezoresponse force microscopy studies of PbTiO3 thin films grown via layer-by-layer gas phase reaction

Applied Physics Letters

Volumn 94, Issue 9, 2009, Pages

  Park, Moonkyu ^a,b   Hong, Seungbum ^b   Kim, Jiyoon ^a   Kim, Yunseok ^a,e   Bühlmann, Simon ^c   Kim, Yong Kwan ^d   No, Kwangsoo ^a  

^a Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

^b ARGONNE NATIONAL LABORATORY   (United States)

^c IMPERIAL COLLEGE LONDON   (United Kingdom)

^d SAMSUNG Electronics   (South Korea)

^e MAX PLANCK INSTITUTE OF MICROSTRUCTURE PHYSICS   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL REACTIONS; ELECTRODEPOSITION; THIN FILMS;

COERCIVE VOLTAGES; DOMAIN SWITCHING; GAS-PHASE REACTIONS; LAYER BY LAYERS; MULTI STEPS; PIEZORESPONSE FORCE MICROSCOPIES; POLED DOMAINS; REACTIVE MAGNETRON SPUTTERING; RETENTION CHARACTERISTICS; RETENTION PROPERTIES; RMS ROUGHNESS; SINGLE STEPS;

FILM GROWTH;

EID: 62149146720     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3081120     Document Type: Article

References (14)

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