Low level features for image appeal measurement

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 7242, Issue , 2009, Pages

  Obrador, Pere ^a   Moroney, Nathan ^b  

^a TELEFONICA RESEARCH   (Spain)

^b HEWLETT PACKARD LABORATORIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FACE FEATURES; GROUND TRUTHS; HUMAN OBSERVERS; LOW-LEVEL FEATURES; OBJECTIVE QUALITY MEASURES; SUBJECTIVE FACTORS; USER STUDIES;

PHOTOGRAPHY;

IMAGE QUALITY;

EID: 62149114421     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.806140     Document Type: Conference Paper

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