Effects of laser parameters on the characteristics of a Sn-3.5 wt.%Ag solder joint

Metals and Materials International

Volumn 15, Issue 1, 2009, Pages 119-123

  Kim, Jeng O ^a   Jung, Jae Pil ^b   Lee, Jae Hoon ^a   Jeong Suh, ^a   Kang, Hee Shin ^a  

^a Korea Institute of Machine and Materials   (South Korea)

^b University of Seoul   (South Korea)

Author keywords

Laser soldering; Lead free solder; Nd:YAG laser; Reliability; Sn 3.5wt. Ag

Indexed keywords

BALL GRID ARRAYS; BINARY ALLOYS; COPPER METALLURGY; ELECTRONICS PACKAGING; HEATING; LASER BEAMS; MICROSTRUCTURE; NEODYMIUM ALLOYS; NEODYMIUM LASERS; POLYCHLORINATED BIPHENYLS; RECRYSTALLIZATION (METALLURGY); RELIABILITY; SILVER ALLOYS; SILVER METALLURGY; SOLDERED JOINTS; SOLDERING; TIN ALLOYS; TIN METALLURGY; YTTRIUM ALLOYS; YTTRIUM ALUMINUM GARNET;

CONTINUOUS WAVE; EXCESSIVE ENERGY; LASER HEAT SOURCES; LASER PARAMETERS; LASER SOLDERING; ND : YAG LASERS; OPTIMAL CONDITIONS; UNDER-BUMP METALLURGIES;

LEAD-FREE SOLDERS;

EID: 62149112482     PISSN: 15989623     EISSN: None     Source Type: Journal    
DOI: 10.1007/s12540-009-0119-3     Document Type: Article

References (15)

1. K. Suganuma, and Curr. Opin, Solid State Mater. Sci. 5, 55 (2001).
2. D. R. Flanders, E. G. Jacobs, and R. F. Pinizzotto, J. Electron Mater. 26, 883 (1997).
3. D. James, and A. Hayward, Proc. Lasers in Microelectronic Manufacturing, (ed., B. Braren) p. 167, SPIE, Bellingham, USA (1991).
4. M. Hartmann, Proc. Lasers in Microelectronic Manufacturing, (ed., B. Braren) p. 179, SPIE, Bellingham, USA (1991).
5. J. H. Lee, D. Park, and Y. S. Kim, J. Electron. Mater. 29, 1154 (2000).
6. C. B. Lee, C. Y. Lee, C. C. Shur, and S. B. Jung, J. KWS 20, 275 (2002).
7. th Conf. Electronic Components and Technology, p. 455, IEEE, San Diego, USA (1999).
8. S. M. Hong, C. S. Kang, and J. P. Jung, J. Kor. Inst. Met. & Mater. 40, 1103 (2002).
9. A. M. Minor and J. J.W. Morris, J. Electron. Mater. 29, 1171 (2000).
10. C. E. Ho, R. Zheng, G. L. Luo, A. H. Lin, and C. R. Kao, J. Electron. Mater. 29, 1179 (2000).
11. K. Zeng and J. K. Kivilahti, J. Electron. Mater. 20, 40 (2001).
12. J. W. Choi, H. S. Cha, and T. S. Oh, Met. Mater. Int. 9, 277 (2003).
13. C. B. Park, S. M. Hong, J. P. Jung, C. S. Kang, and Y. E. Shin, Mater. Trans. 42, 823 (2001).
14. Y. H. Tian, C. Q. Wang, X. D. Zhang, and D. M. Liu, Mater. Sci. Eng. B 95, 256 (2002).
15. J. S. Lee, J. P. Jung, and S. H. Kim, J. KWS 20, 438 (2002).