3D mutifractal analysis: A new tool for epileptic fit sources detection in SPECT images

Proceedings of the 30th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBS'08 - "Personalized Healthcare through Technology"

Volumn , Issue , 2008, Pages 3912-3915

  Lopes, R ^a,b   Viard, R ^a   Dewalle, A S ^a   Steinling, M ^c   Maouche, S ^b   Betrouni, N ^a  

^a INSERM   (France)

^b ECOLE CENTRALE DE LILLE   (France)

^c Lille1 University   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROENCEPHALOGRAPHY; ELECTROPHYSIOLOGY; FRACTALS; IMAGE TEXTURE; MAGNETIC RESONANCE IMAGING; PARTICLE BEAMS; SPECTRUM ANALYSIS; TEXTURES;

EPILEPTIC PATIENTS; IMAGING MODALITY; MATHEMATIC MODEL; MULTI-FRACTAL SPECTRUM; MULTIFRACTAL ANALYSIS; SINGULARITY SPECTRUM; SOURCES DETECTION; SPECT (SINGLE PHOTON EMISSION COMPUTED TOMOGRAPHY);

SINGLE PHOTON EMISSION COMPUTED TOMOGRAPHY;

ALGORITHM; ARTICLE; BRAIN; COMPUTER GRAPHICS; EPILEPSY; FRACTAL ANALYSIS; HUMAN; IMAGE PROCESSING; METHODOLOGY; NEUROLOGIC DISEASE; PATHOLOGY; REFERENCE VALUE; REPRODUCIBILITY; SINGLE PHOTON EMISSION COMPUTER TOMOGRAPHY; THEORETICAL MODEL; THREE DIMENSIONAL IMAGING;

ALGORITHMS; BRAIN; COMPUTER GRAPHICS; EPILEPSY; FRACTALS; HUMANS; IMAGE PROCESSING, COMPUTER-ASSISTED; IMAGING, THREE-DIMENSIONAL; MODELS, THEORETICAL; NERVOUS SYSTEM DISEASES; REFERENCE VALUES; REPRODUCIBILITY OF RESULTS; TOMOGRAPHY, EMISSION-COMPUTED, SINGLE-PHOTON;

EID: 61849089025     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/iembs.2008.4650065     Document Type: Conference Paper

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