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Volumn , Issue , 2008, Pages 593-596

Simulating the effects of atrial fibrillation induced electrical remodeling: A comprehensive simulation study

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EID: 61849087803     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/iembs.2008.4649222     Document Type: Conference Paper
Times cited : (13)

References (21)
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