Tunable graphene dc superconducting quantum interference device

Nano Letters

Volumn 9, Issue 1, 2009, Pages 198-199

  Girit, Çaǧlar ^a,b,d,e   Bouchiat, V ^c,d,e   Naaman, O ^a,d,e   Zhang, Y ^a,d,e   Crommie, M F ^a,b,d,e   Zettl, A ^a,b,d,e   Siddiqi, I ^a,d,e  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^c LABORATOIRE DE CRISTALLOGRAPHIE   (France)

^d UNIVERSITY OF CALIFORNIA   (United States)

^e CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

APPLIED MAGNETIC FIELDS; COOPER PAIRS; ELECTRICAL PROPERTIES; ELECTRONIC TRANSPORTS; ELECTROSTATIC GATES; GRAPHENE; GRAPHENE SHEETS; JOSEPHSON EFFECTS; REDUCED DIMENSIONALITIES; SUPER CURRENTS; SUPERCONDUCTING ELECTRODES; SUPERCONDUCTING QUANTUM INTERFERENCE DEVICES; ULTRASENSITIVE;

ELECTRIC PROPERTIES; ELECTRODES; MAGNETIC FIELDS; QUANTUM INTERFERENCE PHENOMENA; SUPERCONDUCTIVITY;

SQUIDS;

GRAPHITE; NANOPARTICLE;

ARTICLE; CHEMISTRY; COMPUTER AIDED DESIGN; CONFORMATION; ELECTRIC CONDUCTIVITY; EQUIPMENT; EQUIPMENT DESIGN; INSTRUMENTATION; MACROMOLECULE; MATERIALS TESTING; METHODOLOGY; NANOTECHNOLOGY; QUANTUM THEORY; REFRACTOMETRY; REPRODUCIBILITY; SENSITIVITY AND SPECIFICITY; SURFACE PROPERTY; ULTRASTRUCTURE;

COMPUTER-AIDED DESIGN; ELECTRIC CONDUCTIVITY; EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; GRAPHITE; MACROMOLECULAR SUBSTANCES; MATERIALS TESTING; MOLECULAR CONFORMATION; NANOPARTICLES; NANOTECHNOLOGY; QUANTUM THEORY; REFRACTOMETRY; REPRODUCIBILITY OF RESULTS; SENSITIVITY AND SPECIFICITY; SURFACE PROPERTIES;

EID: 61649101577     PISSN: 15306984     EISSN: None     Source Type: Journal    
DOI: 10.1021/nl802765x     Document Type: Article

References (8)

1. Geim, A. K.; Novoselov, K. S. Nat. Mater. 2007, 6, 183.
2. Heersche, H. B.; Jarillo-Herrero, P.; Oostinga, J., B.; Vandersypen, L. M. K.; Morpurgo, A. F. Nature 2007, 486, 56.
3. Du, X.; Skachko, I.; Andrei, E. Y. Phys. Rev. B 2008, 77, 184507.
4. Novoselov, K. S.; Jiang, D.; Schedin, F.; Booth, T. J.; Khotkevich, V. V.; Morozov, S. V.; Geim, A. K. Proc. Natl. Acad. Sci. U.S.A. 2005, 102, 10451.
5. Klapwijk, T. M.; Blonder, G. E.; Tinkham, M. Physica B+C 1982, 109-110, 1657.
6. Titov, M.; Beenakker, C. W. J. Phys. Rev. B. 2006, 74, 041401.
7. SchäPers, T. Springer Tracts Mod. Phys. 2001, 174, 21.
8. Cleuziou, J. P.; Wernsdorfer, W.; Bouchiat, V.; Ondarçuhu, T.; Monthioux, M. Nat. Nanotechnol. 2006, 1, 53.