Controlling the phase and amplitude of plasmon sources at a subwavelength scale

Nano Letters

Volumn 9, Issue 1, 2009, Pages 327-331

  Lerosey, G ^a,c,d   Pile, D F P ^b,c   Mathieu, P ^b,c   Bartel, G ^b,c   Zheng, X ^a,b,c  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^c UNIVERSITY OF CALIFORNIA   (United States)

^d INSTITUT LANGEVIN   (France)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC CAVITIES; FABRY-PEROT RESONANCES; NANO-SCALE; NEW CLASS; SUB WAVELENGTHS; SUBWAVELENGTH SCALE;

OPTICAL DATA STORAGE;

PLASMONS;

NANOMATERIAL;

ARTICLE; CHEMICAL MODEL; CHEMISTRY; COMPUTER SIMULATION; CONFORMATION; CRYSTALLIZATION; MACROMOLECULE; MATERIALS TESTING; METHODOLOGY; NANOTECHNOLOGY; PARTICLE SIZE; REFRACTOMETRY; SURFACE PLASMON RESONANCE; SURFACE PROPERTY; ULTRASTRUCTURE;

COMPUTER SIMULATION; CRYSTALLIZATION; MACROMOLECULAR SUBSTANCES; MATERIALS TESTING; MODELS, CHEMICAL; MOLECULAR CONFORMATION; NANOSTRUCTURES; NANOTECHNOLOGY; PARTICLE SIZE; REFRACTOMETRY; SURFACE PLASMON RESONANCE; SURFACE PROPERTIES;

EID: 61649090749     PISSN: 15306984     EISSN: None     Source Type: Journal    
DOI: 10.1021/nl803079s     Document Type: Article

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20. Thèse quantities assume an incoming plane wave that is directed perpendicularly to the slab of metal. If the plane wave has an angle with the normal of the metal slab, one should take into account the difference of optical path length induced by such an angle between the two cavities. More generally, the shape of the incoming light beam should be taken into account when designing and optical device using such plasmonic sources.