Highly oriented crystalline Er:YAG and Er:YAP layers prepared by PLD and annealing

Applied Surface Science

Volumn 255, Issue 10, 2009, Pages 5292-5294

  Remsa, Jan ^a   Jelinek, Miroslav ^a,b   Kocourek, Tomáš ^a,b   Oswald, Jiří ^a   Studnička, Václav ^a   Čerňanský, Marian ^a   Uherek, František ^c   Jelínek, Michal ^b  

^a INSTITUTE OF PHYSICS   (Czech Republic)

^b CZECH TECHNICAL UNIVERSITY IN PRAGUE   (Czech Republic)

^c INTERNATIONAL LASER CENTER   (Slovakia)

Author keywords

Er:YAG; Laser; PLD; Thin films; Waveguides

Indexed keywords

ALUMINUM COATINGS; ALUMINUM COMPOUNDS; ARGON LASERS; ATOMIC FORCE MICROSCOPY; CRYSTALLINE MATERIALS; FUSED SILICA; LASERS; PEROVSKITE; PEROVSKITE SOLAR CELLS; PULSED LASER DEPOSITION; PULSED LASERS; SAPPHIRE; SUBSTRATES; THIN FILMS; WAVEGUIDES; X RAY DIFFRACTION; YTTRIUM; YTTRIUM ALUMINUM GARNET;

AMORPHOUS LAYER; ARGON FLOW; CRYSTALLINE GRAINS; CRYSTALLINE THIN FILMS; ER: YAG; HIGH QUALITY; HIGH SUBSTRATE TEMPERATURE; PHOTOLUMINESCENCE MEASUREMENTS;

FILM PREPARATION;

EID: 61549098715     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2008.08.037     Document Type: Article

References (20)

1. Jelínek M., Lančok J., Šonský J., Oswald J., Šimečková M., Jastrabík L., and Studnička V. Czech. J. Phys. 48 (1998) 577
2. Jelinek M. Czech. J. Phys. 53 (2003) 365
3. Ferrand B., Chambaz B., and Couchud M. Opt. Mater. 11 (1999) 101
4. Jelínek M., Klini A., Grivas C., Lančok J., Studnička V., Chval J., Macková A., and Fotakis C. Appl. Surf. Sci. 197-198 (2002) 416
5. Jelinek M., Klini A., Oswald J., Studnička V., Fotakis C., and Macková A. Laser Phys. Lett. 1 (2004) 248
6. Beach R.J., Mitchell S.C., Meissner H.E., Meissner O.R., Krupke W.F., McMahon J.M., Bennet W.J., and Shepherd D.P. Opt. Lett. 26 (2001) 881
7. Ferrand B., Chambaz B., and Couchard M. Opt. Mater. 11 (1999) 101
8. Shepherd D.P., Hettrick S.J., Li C., Mackenzie J.I., Beach R.J., Mitchell S.C., and Meissner H.E. J. Phys. D: Appl. Phys. 34 (2001) 2420
9. Bonner C.L., Anderson A.A., Eason R.W., Shepherd D.P., Gill D.S., Grivas C., and Vainos N.A. Opt. Lett. 22 (1997) 988-990
10. Anderson A.A., Bonner C.L., Shepherd D.P., Eason R.W., Grivas C., Gill D.S., and Vainos N.A. Opt. Commun. 144 (1997) 183-186
11. Grivas C., May-Smith T.C., Shepherd D.P., and Eason R.W. Opt. Commun. 229 (2004) 355-361
12. Anderson A.A., Eason R.W., Hickey L.M.B., Jelínek M., Grivas C., Gill D.S., and Vainos N.A. Opt. Lett. 22 (1997) 1556-1559
13. Grivas C., Shepherd D.P., May-Smith T.C., Eason R.W., and Pollnau M. Opt. Express 13 (2005) 210-215
14. Facchini C., Zappetini A., Canali A., Martinelli M., Gabeta G., and Tallarida G. Opt. Mater. 17 (2001) 251
15. Keijser Th.H., Langford J.I., Mittemeijer E.J., and Vogels A.B.P. J. Appl. Cryst. 15 (1982) 308-314
16. Williamson G.K., and Hall W.H. Acta Metall. 1 (1953) 22-31
17. Klug H.P., and Alexander L.E. X-Ray Diffraction Procedures. second ed. (1974), Wiley, New York
18. Sonsky J., Lancok J., Jelinek M., Oswald J., Jastrabic L., and Studnicka V. Appl. Phys. A 66 (1998) 583-586
19. Sonsky J., Jelinek M., Hribek P., Oswald J., Jastrabic L., Studnicka V., Fotakis C., and Grivas C. Laser Phys. 8 (1998) 285-290
20. Lancok J., Jelinek M., Grivas C., Flory F., Lebrasseur E., and Garapon C. Thin Solid Films 346 (1999) 284-289