Alpha, dimension-free, and model-based internal consistency reliability

Psychometrika

Volumn 74, Issue 1, 2009, Pages 137-143

  Bentler, Peter M ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

Common; Error scores; True; Unique

Indexed keywords

EID: 61449153884     PISSN: 00333123     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11336-008-9100-1     Document Type: Article

References (27)

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