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Volumn 281, Issue 3, 2009, Pages 108-114

The effect of endcap electrode holes on the resonant ejection from an ion trap

Author keywords

Endcap hole effects; Higher order field effects; Ion trap; Resonance ejection

Indexed keywords


EID: 61449133989     PISSN: 13873806     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ijms.2008.12.018     Document Type: Article
Times cited : (9)

References (26)
  • 26
    • 0004229164 scopus 로고
    • Wiley Interscience Publications, New York
    • Nayfeh A.H. Perturbation Methods (1973), Wiley Interscience Publications, New York
    • (1973) Perturbation Methods
    • Nayfeh, A.H.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.