|
Volumn 81, Issue 3, 2009, Pages 1255-1261
|
Gas chromatography/surface-assisted laser desorption ionization mass spectrometry of amphetamine-like compounds
|
Author keywords
[No Author keywords available]
|
Indexed keywords
BACKGROUND NOISE;
EXPERIMENTAL CONTROLS;
GAS CHROMATOGRAPHS;
GC/MS ANALYSIS;
LASER DESORPTION IONIZATION MASS SPECTROMETRIES;
LASER FLUENCE;
LOW LEVELS;
MASS SPECTRUM;
MS DETECTIONS;
NANOSTRUCTURED SILICONS;
ORDERS OF MAGNITUDES;
SILICON SUBSTRATES;
TIME OF FLIGHT-MASS SPECTROMETERS;
DESORPTION;
HIGH PERFORMANCE LIQUID CHROMATOGRAPHY;
ION SOURCES;
IONIZATION OF GASES;
IONS;
LASERS;
MASS SPECTROMETERS;
MASS SPECTROMETRY;
PULSED LASER APPLICATIONS;
SPECTRUM ANALYSIS;
SUBSTRATES;
SILICON COMPOUNDS;
AMPHETAMINE;
N BENZYL 1 PHENYLETHYLAMINE;
N ISOPROPYL 1 PHENYLETHYLAMINE;
N METHYL 1 PHENYLETHYLAMINE;
N METHYL,N BENZYL 1 PHENYLETHYLAMINE;
N,N DIMETHYL 1 PHENYLETHYLAMINE;
N,N DIPROPYL 1 PHENYLETHYLAMINE;
PHENETHYLAMINE;
SILICON;
SILICON DIOXIDE;
UNCLASSIFIED DRUG;
ARTICLE;
CONTROLLED STUDY;
GAS CHROMATOGRAPHY;
IONIZATION;
IRRADIATION;
LASER;
MASS SPECTROMETRY;
SEPARATION TECHNIQUE;
SURFACE ASSISTED LASER DESORPTION IONIZATION MASS SPECTROMETRY;
TIME OF FLIGHT MASS SPECTROMETRY;
CHEMISTRY;
MASS FRAGMENTOGRAPHY;
METHODOLOGY;
NANOTECHNOLOGY;
AMPHETAMINE;
GAS CHROMATOGRAPHY-MASS SPECTROMETRY;
LASERS;
NANOTECHNOLOGY;
SILICON;
|
EID: 61449083664
PISSN: 00032700
EISSN: None
Source Type: Journal
DOI: 10.1021/ac802176j Document Type: Article |
Times cited : (21)
|
References (14)
|