Observation of [100] and [010] dark line defects in optically degraded ZnSSe-based LEDs by transmission electron microscopy

Journal of Electronic Materials

Volumn 25, Issue 2, 1996, Pages 239-243

  Salamanca Riba, L ^a   Kuo, L H ^a  

^a UNIVERSITY OF MARYLAND   (United States)

Author keywords

Dark line defects; Mechanism for photodegradation; Photodegradation; Zn1 xCdxSe quantum well

Indexed keywords

EID: 6144276160     PISSN: 03615235     EISSN: None     Source Type: Journal    
DOI: 10.1007/BF02666251     Document Type: Article

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