Nondestructive analysis of structural defects in wide bandgap II-VI heterostructures

Journal of Electronic Materials

Volumn 25, Issue 2, 1996, Pages 235-238

  Goorsky, M S ^a   Lindo, S E ^a   Guha, S ^b,c   Haugen, G M ^b  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b 3M COMPANY   (United States)

^c IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

Diffuse scattering; II VI compounds; Reciprocal space map (RSM); Stacking faults; Triple axis diffraction (TAD)

Indexed keywords

EID: 6144268035     PISSN: 03615235     EISSN: None     Source Type: Journal    
DOI: 10.1007/BF02666250     Document Type: Article

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