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Volumn 36, Issue 8, 1997, Pages 2233-2239

Infrared interferometry for rough surface measurements: Application to failure characterization and flaw detection

Author keywords

Crack tip fields; Flaw detection; Infrared interferometers; Rough surface measurements; Twyman Green interferometers

Indexed keywords


EID: 6144251235     PISSN: 00913286     EISSN: None     Source Type: Journal    
DOI: 10.1117/1.601447     Document Type: Article
Times cited : (22)

References (10)
  • 3
    • 0019021859 scopus 로고
    • Rough surface interferometry at 10.6 μm
    • O. Kwon, J. C. Wyant, and C. R. Hayslett, "Rough surface interferometry at 10.6 μm," Appl. Opt. 19, 1862-1869 (1980).
    • (1980) Appl. Opt. , vol.19 , pp. 1862-1869
    • Kwon, O.1    Wyant, J.C.2    Hayslett, C.R.3
  • 4
    • 84975606518 scopus 로고
    • Lateral shear interferometer for infrared and visible light
    • J. Lewandowski, "Lateral shear interferometer for infrared and visible light," Appl. Opt. 28, 2373-2379 (1989).
    • (1989) Appl. Opt. , vol.28 , pp. 2373-2379
    • Lewandowski, J.1
  • 5
    • 0001354952 scopus 로고
    • Roughness measurement of machined surfaces by means of the speckle technique in the visible and infrared regions
    • U. Persson, "Roughness measurement of machined surfaces by means of the speckle technique in the visible and infrared regions," Opt. Eng. 32, 3327-3332 (1993).
    • (1993) Opt. Eng. , vol.32 , pp. 3327-3332
    • Persson, U.1
  • 10
    • 0031075333 scopus 로고    scopus 로고
    • An interferometric and finite element study of interfacial crack tip fields and the influence of modemixity on 3D deformations
    • J. K. Sinha, H. V. Tippur, and L. Xu, "An interferometric and finite element study of interfacial crack tip fields and the influence of modemixity on 3D deformations," Int. J. Solids & Struct. 34, 741-754 (1997).
    • (1997) Int. J. Solids & Struct. , vol.34 , pp. 741-754
    • Sinha, J.K.1    Tippur, H.V.2    Xu, L.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.