|
Volumn 36, Issue 8, 1997, Pages 2233-2239
|
Infrared interferometry for rough surface measurements: Application to failure characterization and flaw detection
|
Author keywords
Crack tip fields; Flaw detection; Infrared interferometers; Rough surface measurements; Twyman Green interferometers
|
Indexed keywords
|
EID: 6144251235
PISSN: 00913286
EISSN: None
Source Type: Journal
DOI: 10.1117/1.601447 Document Type: Article |
Times cited : (22)
|
References (10)
|