Fast algorithms for foggy image enhancement based on convolution

Proceedings of the 2008 International Symposium on Computational Intelligence and Design, ISCID 2008

Volumn 2, Issue , 2008, Pages 165-168

  Xianqiao, Chen ^a   Xinping, Yan ^a   Xiumin, Chu ^a  

^a WUHAN UNIVERSITY OF TECHNOLOGY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ARTIFICIAL INTELLIGENCE; COMPUTATION THEORY;

COMPUTATION TASKS; COMPUTATION WORK; FAST ALGORITHMS; NON-UNIFORMITIES; REAL TIME PERFORMANCE; RETINEX THEORY; UNCERTAIN FACTORS; VISION ENHANCEMENT;

IMAGE ENHANCEMENT;

EID: 61349203818     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/iscid.2008.221     Document Type: Conference Paper

References (9)

1. J, P. Oakley and B. L, Satherley, "Improving image quality in poor visibility conditions using a physical model for contrast degradation", IEEE Trans. Image Processing, 1998, 14(3): 167-179.
2. M.J. Robinson, D.W. Armitage and J. P. Oakley, "Seeing in the mist: real time video enhancement," Sensor Review, 2002, 22: 157-161.
3. Liu Jinfeng, Huang Feng, "A restoration method of atmospheric degraded image based radiative transfer equation", Chinese journal of light scattering, 2005, 16(4): 364-369.
4. Zhu Pei, Zhu Hong, Qian Xueming, Li Han, "An image clearness method for fog", Jou rnal of Im age and Graph ics, 2004, 9(1): 124-128.
5. Zhou Xuan, Zhou Shudao, Huang Feng, Zhu Fumeng, "Disposal of image of atmospheric degradation", Geomatics and Information Science of Wuhan University, 2005, 30(81): 720-722.
6. KokKeong Tan, Oakley, J. P. "Enhancement of color images in poor visibility conditions. International conference on image processing", Vol. 2. 2000:788-791.
7. Edwin H. Land, John J. McCann, "Lightness and retinex theory", Journal of the Optical Society of America, 1971, 61(1): 1-11
8. E. Land, "Recent advances in retinex theory", Vis. Res., 1986, Vol. 26: 7-21
9. Ying Li, Changzhi Hou, etc, "Enhancement of infrared image based on the Retinex theory", Proceedings of the 29th Annual International Conference of the IEEE EMBS Cité Internationale, Lyon, France August 23-26, 2007. 3315-3318