|
Volumn 102, Issue 5, 2009, Pages
|
Measuring domain wall fidelity lengths using a chirality filter
a a a a a a a |
Author keywords
[No Author keywords available]
|
Indexed keywords
CHIRALITY;
COMPUTER SIMULATION;
DIELECTRIC WAVEGUIDES;
ELECTRIC WIRE;
ENANTIOMERS;
STEREOCHEMISTRY;
WALLS (STRUCTURAL PARTITIONS);
ANALYTICAL MODELS;
FIELD DEPENDENCES;
LENGTH SCALE;
MINIMUM DISTANCES;
NUMERICAL SIMULATIONS;
PERMALLOY NANOWIRES;
STRUCTURAL CHANGES;
DOMAIN WALLS;
|
EID: 61349159974
PISSN: 00319007
EISSN: 10797114
Source Type: Journal
DOI: 10.1103/PhysRevLett.102.057209 Document Type: Article |
Times cited : (63)
|
References (17)
|