Determination of electron energy, spectral width, and beam divergence at the exit window for clinical megavoltage x-ray beams

Medical Physics

Volumn 36, Issue 3, 2009, Pages 698-707

  Sawkey, D L ^a   Faddegon, B A ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON BEAMS; ELECTRON ENERGY LEVELS; ELECTRON SOURCES; ELECTRONS; GAUSSIAN BEAMS; IONIZATION; MANUFACTURE; MONTE CARLO METHODS; UNCERTAINTY ANALYSIS; X RAYS;

DETECTOR POSITIONS; FLATTENING FILTERS; FULL WIDTHS AT HALF MAXIMUMS; PHYSICAL CHARACTERISTICS; RELATIVE POSITIONS; SIMULATION CONFIGURATION; SOURCE CHARACTERISTICS; SPECTRAL DISTRIBUTION;

X RAY DETECTORS;

ARTICLE; DOSIMETRY; ELECTRON BEAM; MEGAVOLTAGE RADIATION; MONTE CARLO METHOD; PRIORITY JOURNAL; RADIATION BEAM; RADIATION DOSE DISTRIBUTION; SIMULATION;

EID: 61349126070     PISSN: 00942405     EISSN: None     Source Type: Journal    
DOI: 10.1118/1.3070547     Document Type: Article

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