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Volumn 472, Issue 1-2, 2009, Pages 434-440
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Electric, dielectric and magnetic characteristics of Cr3+, Mn3+ and Fe3+ substituted MgAl2O4: Effect of pH and annealing temperature
a
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Author keywords
Nanostructured materials; Precipitation; Semiconductors; Thermal analysis; X ray diffraction
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Indexed keywords
AGGLOMERATION;
CERAMIC CAPACITORS;
CHROMIUM;
COPRECIPITATION;
CRYSTALS;
DIELECTRIC LOSSES;
DIFFRACTION;
ELECTRIC CONDUCTIVITY;
ELECTRIC RESISTANCE;
MANGANESE;
MANGANESE COMPOUNDS;
METAL ANALYSIS;
NANOSTRUCTURED MATERIALS;
PH EFFECTS;
PROBES;
SCANNING;
SCANNING ELECTRON MICROSCOPY;
SCANNING PROBE MICROSCOPY;
SEMICONDUCTOR MATERIALS;
THERMAL EFFECTS;
THERMOANALYSIS;
X RAY DIFFRACTION;
ANNEALING TEMPERATURES;
CHEMICAL CO-PRECIPITATION METHODS;
CO PRECIPITATES;
DC ELECTRICAL;
DIELECTRIC CONSTANTS;
ELECTRICAL RESISTIVITIES;
ENDOTHERMIC PEAKS;
ENERGY-DISPERSIVE X-RAYS;
IRON-DOPED SAMPLES;
MAGNETIC CHARACTERISTICS;
PH VALUES;
POWDER X-RAY DIFFRACTIONS;
PRECIPITATION;
PROBE METHODS;
QUANTITATIVE ELEMENTAL ANALYSIS;
SCANNING PROBES;
SEMICONDUCTORS;
SINGLE PHASE;
SPINEL PHASE;
TEMPERATURE RANGES;
THERMAL ANALYSIS;
TWO POINTS;
X RAY DIFFRACTION ANALYSIS;
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EID: 61349120123
PISSN: 09258388
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jallcom.2008.04.079 Document Type: Article |
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Times cited : (45)
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References (29)
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