The consequences of technostress for end users in organizations: Conceptual development and validation

Information Systems Research

Volumn 19, Issue 4, 2008, Pages 417-433

  Ragu Nathan, T S ^a   Tarafdar, Monideepa ^a   Ragu Nathan, Bhanu S ^a   Tu, Qiang ^b  

^a UNIVERSITY OF TOLEDO   (United States)

^b ROCHESTER INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

Confirmatory factor analysis; Continuance commitment; Job satisfaction; Management of ICTs; Organizational commitment; Structural equation modeling; Survey methods; Technostress

Indexed keywords

FACTOR ANALYSIS; SURVEYS;

CONFIRMATORY FACTOR ANALYSIS; CONTINUANCE COMMITMENTS; ORGANIZATIONAL COMMITMENT; STRUCTURAL EQUATION MODELING; SURVEY METHODS; TECHNOSTRESS;

JOB SATISFACTION;

EID: 61349088062     PISSN: 10477047     EISSN: 15265536     Source Type: Journal    
DOI: 10.1287/isre.1070.0165     Document Type: Article

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