Near-infrared digital photography to estimate snow correlation length for microwave emission modeling

Applied Optics

Volumn 47, Issue 36, 2008, Pages 6723-6733

  Toure, Ally Mounirou ^a   Goïta, Kalifa ^a   Royer, Alain ^a   Mätzler, Christian ^b   Schneebeli, Martin ^c  

^a UNIVERSITÉ DE SHERBROOKE   (Canada)

^b UNIVERSITY OF BERN   (Switzerland)

^c WSL INSTITUTE FOR SNOW AND AVALANCHE RESEARCH SLF   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

RADIATIVE TRANSFER; REFLECTION; SNOW;

CORRELATION LENGTHS; DIGITAL PHOTOGRAPHY; EXPERIMENTAL CONDITIONS; MICROWAVE EMISSION MODELS; MICROWAVE SCATTERING; NEAR INFRA-RED REFLECTANCES; RADIATIVE TRANSFER MODEL; SPECIFIC SURFACE AREA (SSA);

INFRARED DEVICES;

EID: 60949111236     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.47.006723     Document Type: Article

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