|
Volumn 636, Issue 2, 2009, Pages 236-241
|
Rapid and quantitative determination of critical micelle concentration by automatic continuous mixing and static light scattering
|
Author keywords
Automatic continuous mixing technique; cmc; Static light scattering; Surfactant
|
Indexed keywords
AGGREGATION NUMBERS;
ANALYSIS OF DATUM;
ASSOCIATION MODELS;
AUTOMATIC CONTINUOUS MIXING TECHNIQUE;
CMC;
CONTINUOUS DATUM;
DATA SETS;
MANUAL INTERVENTIONS;
NON IONICS;
QUANTITATIVE CHARACTERIZATIONS;
QUANTITATIVE DETERMINATIONS;
STATIC LIGHT SCATTERING;
SURFACTANT;
ZWITTERIONIC SURFACTANTS;
AGGLOMERATION;
CRITICAL MICELLE CONCENTRATION;
LIGHT SCATTERING;
MICELLES;
REFRACTION;
SURFACE TENSION;
SCATTERING;
|
EID: 60949089564
PISSN: 00032670
EISSN: 18734324
Source Type: Journal
DOI: 10.1016/j.aca.2009.02.011 Document Type: Article |
Times cited : (45)
|
References (25)
|