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Volumn 321, Issue 7, 2009, Pages 699-701
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Element specific measurements of the structural properties and magnetism of Cox Zn1 - x O
a
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Author keywords
Dilute magnetic semiconductors; Magnetic properties of thin films; X ray linear dichroism
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Indexed keywords
CRYSTALS;
DICHROISM;
ELECTRIC CONDUCTIVITY;
MAGNETIC PROPERTIES;
MAGNETIC SEMICONDUCTORS;
MAGNETISM;
MAGNETRONS;
OXYGEN;
OXYGEN VACANCIES;
POSITIVE IONS;
PROGRAMMABLE LOGIC CONTROLLERS;
PULSED LASER DEPOSITION;
QUANTUM INTERFERENCE DEVICES;
SEMICONDUCTING ANTIMONY;
SEMICONDUCTOR GROWTH;
STRUCTURAL PROPERTIES;
ZINC;
CATION TYPES;
CRYSTALLINE QUALITIES;
DIFFRACTION MEASUREMENTS;
DILUTE MAGNETIC SEMICONDUCTORS;
ELEMENT SPECIFICS;
FIELD COOLED;
GROWTH PROCESS;
LOCAL STRUCTURAL PROPERTIES;
MAGNETIC PROPERTIES OF THIN FILMS;
MAGNETIZATION MEASUREMENTS;
MAGNETRON SPUTTERED FILMS;
PULSED LASERS;
REACTIVE MAGNETRON SPUTTERING;
REDUCED OXYGEN PARTIAL PRESSURES;
ROOM TEMPERATURES;
STRUCTURAL PERFECTIONS;
STRUCTURAL QUALITIES;
SUPERCONDUCTING QUANTUM INTERFERENCE DEVICES;
X-RAY LINEAR DICHROISM;
MAGNETIC THIN FILMS;
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EID: 60949083514
PISSN: 03048853
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jmmm.2008.11.028 Document Type: Article |
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Times cited : (7)
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References (7)
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