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Volumn 47, Issue 28, 2008, Pages 5117-5122

Determination of optical parameters of very thin (λ/50) films

Author keywords

[No Author keywords available]

Indexed keywords

OPTICS;

EID: 60849131509     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.47.005117     Document Type: Article
Times cited : (6)

References (11)
  • 1
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    • Retrieval of optical constants and thickness of thin films from transmission spectra
    • I. Chambouleyron, J. M. Martinez, A. C. Morettin, and M, Mulato, "Retrieval of optical constants and thickness of thin films from transmission spectra," Appl. Opt. 36, 8238-8247 (1997).
    • (1997) Appl. Opt , vol.36 , pp. 8238-8247
    • Chambouleyron, I.1    Martinez, J.M.2    Morettin, A.C.3    Mulato, M.4
  • 2
    • 0037415858 scopus 로고    scopus 로고
    • A method for determining thickness and optical constants of absorbing thin films
    • D. Pekker and L. Pekker, " A method for determining thickness and optical constants of absorbing thin films," Thin Solid Films 425, 203-209 (2003).
    • (2003) Thin Solid Films , vol.425 , pp. 203-209
    • Pekker, D.1    Pekker, L.2
  • 3
    • 33747104241 scopus 로고    scopus 로고
    • Optical properties of silver thin films deposited by magnetron sputtering with different thicknesses
    • X. Sun, R. Hong, H. Hou, Z. Fan, and J. Shao, "Optical properties of silver thin films deposited by magnetron sputtering with different thicknesses," Chin. Opt. Lett. 4, 366-369 (2006).
    • (2006) Chin. Opt. Lett , vol.4 , pp. 366-369
    • Sun, X.1    Hong, R.2    Hou, H.3    Fan, Z.4    Shao, J.5
  • 4
    • 43949166262 scopus 로고
    • Techniques for ellipsometric measurements of thickness and optical constants of thin absorbing films
    • W. McGahan, B. Johs, and J. Woollam, "Techniques for ellipsometric measurements of thickness and optical constants of thin absorbing films," Thin Solid Films 234, 443-446 (1993).
    • (1993) Thin Solid Films , vol.234 , pp. 443-446
    • McGahan, W.1    Johs, B.2    Woollam, J.3
  • 6
    • 0018108152 scopus 로고
    • The inverse problem of the Phenomenological theory of the optical properties of thin films
    • E. Bondar, Yu. Kulyupin, and N. Popovich, "The inverse problem of the Phenomenological theory of the optical properties of thin films," Thin Solid Films 55, 201-209 (1978).
    • (1978) Thin Solid Films , vol.55 , pp. 201-209
    • Bondar, E.1    Kulyupin, Y.2    Popovich, N.3
  • 7
    • 0000213869 scopus 로고
    • Zur optik dünner metallfilme
    • H. Wolter, "Zur optik dünner metallfilme," Z. Phys. 105, 269-308 (1937).
    • (1937) Z. Phys , vol.105 , pp. 269-308
    • Wolter, H.1
  • 8
    • 84893888408 scopus 로고    scopus 로고
    • F. Abeles, Facteurs de reflexion et de transmission des coudhes metalliques tres minces: Methode nouvell pour determiner leurs indeces et leurs epaisseurs, Rev. Opt., Theor. Instrum. 32, 257-268 (1953).
    • F. Abeles, "Facteurs de reflexion et de transmission des coudhes metalliques tres minces: Methode nouvell pour determiner leurs indeces et leurs epaisseurs," Rev. Opt., Theor. Instrum. 32, 257-268 (1953).
  • 10
    • 38749143266 scopus 로고    scopus 로고
    • Analytical solution of the inverse optical problem for very thin films
    • B. Hristov, P. Gushterova, and P. Sharlandjiev, "Analytical solution of the inverse optical problem for very thin films," J. Optoelectron. Adv. Mater. 9, 217-220 (2007).
    • (2007) J. Optoelectron. Adv. Mater , vol.9 , pp. 217-220
    • Hristov, B.1    Gushterova, P.2    Sharlandjiev, P.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.