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Volumn 471, Issue 1-2, 2009, Pages 432-434
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Phase transformations in Ho2Si2O7 ceramics
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Author keywords
Crystal growth; Insulators; X ray diffraction
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Indexed keywords
CRYSTAL GROWTH;
CRYSTALLIZATION;
DIFFRACTION;
GRAIN BOUNDARIES;
HOLMIUM;
LATTICE CONSTANTS;
SILICON;
X RAY DIFFRACTION;
X RAY DIFFRACTION ANALYSIS;
FLUX METHODS;
HIGH TEMPERATURES;
INSULATORS;
LOW-TEMPERATURE PHASE;
OPTICALLY CLEARS;
ORTHORHOMBIC MODIFICATIONS;
PHASE TRANSFORMATIONS;
SPACE GROUPS;
X-RAY DIFFRACTION STUDIES;
SINGLE CRYSTALS;
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EID: 60849130719
PISSN: 09258388
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jallcom.2008.03.108 Document Type: Article |
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Times cited : (18)
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References (15)
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